• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    An analysis apparatus for analyzing a sample at a particular depth, comprising a dry coupling element which serves as a transmission medium for conducting an analysis pulse in the sample, the dry coupling element being sufficiently thick so that a reflection that has traveled from the particular depth reaches the level of the analysis apparatus before a reflection that represents a second reflection of the analysis pulse on the boundary between the dry coupling element and the sample.
    公开号:FR3018610A1
    申请号:FR1552165
    申请日:2015-03-17
    公开日:2015-09-18
    发明作者:Eskil Skoglund；Arnt-Borre Salberg；Tore Baarstad；Johan Skjelstad
    申请人:DolphiTech AS；
    IPC主号:
    专利说明:

    [0001] B13663EN-DIV - DOL01-100019EN1 1 DETECTOR MODULE PROVIDED WITH AN ADAPTIVE SUPPORT ELEMENT Field The invention relates to an analysis apparatus arranged to transmit analysis pulses to a sample and to receive reflections of these pulses from the sample.
    [0002] Ultrasounds are oscillations of sound pressure waves that can be used to detect objects and measure distances. An emitted sound wave is reflected and refracted when it encounters materials with different acoustic impedance properties. If these reflections and refractions are detected and analyzed, the resulting data can be used to generate images of the environment through which the sound wave has traveled. Ultrasound can also be used to analyze a physical object. Most ultrasonic frequencies are strongly attenuated by air and air-object boundaries tend to exhibit strong impedance mismatch. Some form of coupling medium is required if the ultrasound signals have to penetrate sufficiently into the object. Often the coupling medium is a liquid, such as water or some forms of gel. Ultrasound can be used to identify particular structural features in an object. For example, ultrasound can be used for nondestructive testing by detecting the size and position of defects in a sample. Non-destructive testing is typically performed in an industrial environment in which it is impractical to use a coupling medium. US Patent 5773811 discloses a scanner that can be used to identify material defects during non-destructive inspection procedures. It uses a gel pack to communicate ultrasonic energy into the substrate. This is more convenient than using a containerless gel, but it can be difficult to accurately determine the depth of elements below the surface of the substrate. Dry couplings are also possible, as in the US 8453928 matrix code reading system. However, sample surfaces tend to be fairly flat in matrix code reading applications, while surfaces are often irregular in non-destructive testing applications. Non-destructive testing applications also require the scanner to scan deeper depths than raster code reading applications. There is a need in the art for an improved analysis apparatus. According to one embodiment, there is provided an analysis apparatus comprising a receiver circuit and an emitter circuit, the two circuits being flexible such that they are capable of conforming to the relief of the surface of an object when a surface of the apparatus is pressed against it, and an adaptive support member positioned behind the transmitter and receiver circuits in the analysis apparatus and arranged for, when the analysis apparatus is pressed against the object , comply with flexible circuits. The analysis apparatus may comprise a dry coupling element which is arranged in front of the transmitter and receiver circuits in the analysis apparatus.
    [0003] B13663EN-DIV - DOL01-100019EN1 3 The dry coupling element may be arranged to serve as a transmission medium for conducting analysis signals in the object. The dry coupling element can form the surface of the analysis module. The dry coupling element may be flexible so that when the surface of the analysis module is pressed against an object to be analyzed, the dry coupling element adapts to the relief of the surface of the object. The flexible circuits may be arranged to accommodate the relief of the surface of the object by flexing in accordance with the dry coupling element as it adjusts to the relief of the surface of the object. The flexible circuits may be arranged to flex inwardly in accordance with any inward deflection of the dry coupling member in the analysis apparatus. The adaptive support member may be compressible. The analysis apparatus may comprise a relatively rigid surface disposed behind the adaptive support member in the analysis apparatus, the adaptive support member being arranged to conform to the shape of the flexible circuitry. compressing against the rigid surface to adapt to any deformation of the flexible circuits. The rigid frame can be arranged to hold the analysis module so that the flexible circuits are sandwiched between the dry coupling element and the adaptive support element. The back of the solid frame may form the solid surface against which the adaptive backing member is compressed. The front of the solid frame can be opened so that the dry coupling element forms the surface of the analysis module.
    [0004] B13663EN-DIV - DOL01-100019EN1 4 The transmitter circuit and the receiver circuit can be respectively arranged to transmit and receive ultrasonic signals. The transmitter and receiver circuits may be arranged to serve as an ultrasound transducer. The analysis apparatus can be arranged to analyze the object by emitting ultrasonic signals to the object and receiving reflections of these ultrasound signals from the object, the adaptive support member being arranged to absorb Substantially all of the reflected signals that reach it. The thickness of the adaptive support member may depend on the compressibility of the material with which it is formed. The dry coupling element may be less compressible than the adaptive support element. According to a second embodiment, there is provided an analysis apparatus for analyzing a sample at a particular depth, comprising a transmission module arranged to transmit an analysis pulse to the sample, a reception module arranged to receive analysis pulse pulses from the sample, a detection module arranged to detect reflections that have traveled from the particular depth in the sample to the analysis apparatus and an element The dry coupling element serves as a transmission medium for conducting the analysis pulse into the sample, the dry coupling element being sufficiently thick so that a reflection that has traveled from the particular depth reaches the level of the analysis apparatus before a reflection which represents a second reflection of the analysis pulse on the boundary between the dry coupling element and the sample. The detection module may be arranged to temporally block the received reflections so that the reflection that has traveled from the particular depth is detected and the reflection that represents the second reflection is not detected.
    [0005] B13663EN-DIV - DOL01-100019EN1 The dry coupling element may have a thickness of between 1 mm and 10 mm. The dry coupling element may have a thickness of between 1 mm and 5 mm. According to a third embodiment, there is provided a method of manufacturing an analysis apparatus, the apparatus design comprising: determining a particular depth in a sample, to which the analysis apparatus is capable of analyze ; and selecting a thickness for a dry coupling element to be used to conduct analysis pulses in the sample as a function of the particular depth; and physically produce the apparatus so designed. The method of manufacture may include selecting the thickness of the dry coupling member to be sufficient for reflection that has traveled from the particular depth in the sample to arrive at the analysis apparatus. before a reflection which represents a second reflection of the analysis pulse on the boundary between the dry coupling element and the sample.
    [0006] The manufacturing method may include designing a detection module that can be arranged to detect a reflection that has traveled from the particular depth and not to detect the reflection that represents the second reflection of the analysis pulse on. the boundary between the dry coupling element and the sample. The manufacturing method may include a design of the detection module including a time window block. The present invention will now be described by way of example with reference to the accompanying drawings. In the drawings: FIG. 1 represents an example of the layers included in an analysis apparatus; FIG. 2 represents an example of the layers included in an analysis apparatus; B13663EN-DIV - DOL01-100019EN1 6 Figure 3 shows an example of an analysis pulse which is reflected internally by a dry coupling element; Fig. 4 shows an example of a manufacturing method; and Figure 5 shows an example of an analysis apparatus. An analysis apparatus may be provided with an adaptive support member to assist its analysis surface to conform to uneven, uneven surfaces. The apparatus suitably comprises an analysis module comprising a receiver circuit and a transmitter circuit. The analysis module may be arranged to transmit and receive ultrasonic pulses via the transmitter and receiver circuits, although any suitable types of analysis signals may be used. The two circuits are flexible so that they can adapt to the relief of the surface of an object. The adaptive support element is disposed behind the transmitter and receiver circuits. It is arranged to conform to the shape of the circuits as they flex in response to pressure against a non-flat surface. An example of an analysis apparatus is shown in FIG. 1. The apparatus has been decomposed into component parts for ease of illustration. The apparatus is generally referenced 101. The apparatus comprises a dry coupling member 102. The dry coupling member forms the analysis surface. It is arranged to serve as a transmission medium for the analysis signals. In one example, the analysis signals are ultrasonic signals that tend to be strongly attenuated by the air. It is important that the dry coupling element be able to conform to all the irregularities of the surface of the sample so that the ultrasound does not encounter air on their path in the sample. Suitably, the dry coupling member is both soft and soft. Preferably, the dry coupling member is compressible so that it can deform inwardly of the apparatus as the operator presses the test surface against the sample.
    [0007] B13663EN-DIV - DOL01-100019EN1 7 The receiver and transmitter circuits 103, 104 are arranged behind the dry coupling element. They can consist of very thin printed circuit boards. In one example, the transmitter and receiver circuits comprise a plurality of elongated electrodes deposited in parallel lines on a flexible base layer. The transmitter and receiver circuits can be laminated one on the other. They can be arranged in such a way that their respective electrodes overlap at right angles to form an intersection pattern. Intersections 10 form a network of analysis elements. The transmitter and receiver circuits can sandwich a layer of acoustic material 108 to form an ultrasonic transducer. The transmitter and receiver circuits are flexible so that they can flex or deform in accordance with various movements of the dry coupling element. If the dry coupling member is pressed inwardly so that it enters the space normally occupied by the flexible circuits, the flexible circuits will flex inwardly to accommodate it. An adaptive support member 105 is disposed behind the transmitter and receiver circuits. It can comply with flexible circuits transmitter and receiver. Suitably, the dry coupling element is compressible. In a preferred example, the adaptive support member is less compressible than the dry coupling member, so that the dry coupling member 25 can not adopt a curvature to which the other layers of the apparatus can not not adapt. The adaptive support member may be softer than the dry coupling member. The dry coupling element, the flexible circuits and the adaptive support member are held in place by a frame 106 which is relatively rigid compared to the other layers. It forms a firm surface 107 behind the adaptive support element. Indeed, the adaptive support member provides the transmitter and receiver circuits the ability to flex inwardly when the apparatus is pressed against a non-flat surface and protects them from damage against the rigid frame in such a case.
    [0008] B13663EN-DIV - DOL01-100019EN1 8 The device is therefore able to adapt to non-flat surfaces. It is particularly suitable for applications in which sample surfaces may be curved or irregular. An example is the non-destructive test. It is also particularly useful when the apparatus uses (i) a matrix network for transmitting and receiving an analysis signal and (ii) a dry coupling element for conducting analysis signals in the sample. An advantage of having a matrix lattice is that it is two dimensional, so that a three-dimensional section of the sample can be analyzed while the apparatus is held stationary against the surface of the sample. Some other scanners have only one line of analysis items. The scanner must then be moved to the surface of the sample to analyze a two-dimensional section. This is disadvantageous, but it means that the device is naturally adaptable to curved surfaces. The examples described herein allow an apparatus comprising a matrix array to conform to a non-flat sample surface. The advantages of fixed analysis and curved surface analysis can therefore be combined in one device. The use of a dry coupling element is advantageous in non-destructive testing applications since it avoids having to use a liquid or gel coupling.
    [0009] However, a dry coupling element is not necessarily as adaptable to irregular sample surfaces as a liquid. Having a flexible dry coupling element is useful but there is a risk that other components of the apparatus, in particular the transmitter and receiver circuits, which are necessarily arranged behind the dry coupling element to generate the analysis signals can be damaged if the dry coupling element deforms by a relatively large amount to fit a curved sample. By using a combination of flexible circuits and an adaptive support element, the apparatus can effectively treat curved surfaces. An example of the layers that may be part of an analysis apparatus is shown in Figure 2. The dry coupling member 201 may be an elastomer or other suitable materials. The thickness of the dry coupling element can be adapted to the thickness of the sample to be analyzed (this is described in more detail below). Behind the dry coupling element is a laminated transducer 202. It consists of transmitter circuits 203 and receiver 204 which are respectively made of copper deposited on a polyimide film. Each copper layer can form a series of electrodes. The electrodes can also be made of other materials, gold for example. A layer of piezoelectric material 205 (PVDF in this example) is sandwiched between the copper layers. This layer generates ultrasonic signals when a high voltage pulse train is sent to the emitter electrode, causing the piezoelectric layer to begin to vibrate and produce an ultrasonic wave. In other examples, the transducer may not include the adhesive or base film layers. The electrodes can be deposited directly on the piezoelectric layer. The number of transmitter and receiver electrodes can be resized. As a result, the transducers can be designed with any desired size and shape. The width of the electrode is also resizable to adjust the amount of energy supplied by the electrode. The width of the electrode can also be adjusted according to the desired focus. The distance between the electrodes can also vary. In general, it is preferable to have small gaps between adjacent electrodes to maximize ultrasonic energy by stimulating as large a region of the piezoelectric layer as possible. The thickness of the electrodes can be chosen to control factors such as frequency, energy and beam focusing. The thickness of the base film can be chosen to control factors such as shape, frequency and signal energy. The thickness of PVDF can also be adapted to change the shape, frequency and energy of the signal (which also depend on the shape of the emission pulse).
    [0010] The thickness of the dry coupling element can be adapted to create a particular time interval between the emission of the ultrasonic pulses and the reception of their reflections from the sample. The support member 206 may be thick enough to provide good adaptation to curved or irregular surfaces. The thickness also depends on the flexibility of the material in which the adaptive support member is formed. In many embodiments, the adaptive support member will adapt to the curvature of the flexible circuits and the dry coupling member facing it by compression against the relatively rigid surface provided by the frame. The adaptive support member is preferably sufficiently thick to absorb all ultrasonic reflections that enter the transmitter / receiver circuits. The relatively rigid surface behind the adaptive support element reflects the ultrasonic waves; therefore, it is important that the ultrasound signal has sufficiently weakened before reaching it. The adaptive support element is thus preferably made of a material having good properties of damping ultrasonic signals.
    [0011] The thickness thus also depends on the damping properties of the material in which the adaptive support element is formed. In a different arrangement, it would be possible to form the adaptive backing member of a material that has good ultrasonic reflection, so that reflection by the adaptive backing member is part of the transmitted pulse. The adaptive support member preferably has a thickness of between 1 mm and 10 mm. In one example, the thickness is about 3 mm and the adaptive support member is made of silicone (for example EL RT 743LV-K). This is just one example since there is a wide range of materials (including many silicones) that could be suitable for the adaptive support element. In most embodiments, the apparatus will have a substantially flat analysis surface when the apparatus is not in use. Usually this means that the surface of the outer dry coupling member of the apparatus is flat, which usually means that the transmitter and receiver circuits are flat and so is the surface of the support member adaptive device that connects the transmitter and receiver circuits. However, the transmitter and receiver circuits could be designed with any desired shape, including convex or concave designs. The outer surface of the dry coupling member could also be shaped to have a convex or concave shape. The apparatus could thus be adapted to analyze samples having a particularly pronounced curvature. The inner surface of the dry coupling member may mimic the concave / convex shape of its outer surface or may be substantially flat. In practice, a dry coupling element of uniform thickness is often preferable, particularly in nondestructive testing applications where accurate depth measurement is important. This will require matching the curvature between the transceiver circuits and the adaptive support element. For ease of use, the dry coupling member is preferably sufficiently flexible and / or compressible to conform to an irregular or curved sample surface when pressed against the surface by a human operator using a relative force. low. The rigid frame is "rigid" only in comparison with the flexibility of the other layers, namely the adaptive support element, the transmission / reception circuits and the dry coupling element. Preferably, the rigid frame does not deform or flex when pressed against the surface of the sample with a force that is sufficient to fit the other layers to the surface of the sample. The rigid frame can be rubber.
    [0012] In one example, the thickness of the dry coupling element can be adapted to a particular depth of analysis. The depth of analysis may be the thickness of the sample if it is desired to analyze the entire sample. The depth of analysis may be less than the thickness of the sample if only a particular section of the sample is to be analyzed. The thickness of the dry coupling member may be selected during the manufacturing process as part of the design of the analysis apparatus for a particular application. The thickness of the dry coupling element affects the delay that the device sees between the emission of analysis pulses on the sample and the reception of their reflections. The apparatus is suitably arranged to emit analysis pulses having a particular shape so that it can recognize the reflections of these pulses and determine the time it took for these reflections to return to the apparatus through the sample. Reflections are normally triggered by impedance mismatches between materials that the analysis pulses encounter at the boundary between one material / substance and another. The time for the reflections to return to the device determines how deep in the sample is the material boundary that triggered the reflection. The apparatus suitably comprises a detection module (which may be at least partially implemented by a signal processor) for recognizing the reflections of the transmitted pulses. The dry coupling element serves as a transmission medium for coupling the analysis signals into the sample. The dry coupling element is preferably made of a material that propagates the analysis signals well. However, there will inevitably be impedance mismatches between the dry coupling element and the sample, which will trigger a reflection of the analysis pulse. This reflection is in general not interesting. The apparatus can effectively ignore it by performing a time window blocking of the received signal. However, at least a part of the first reflection may itself be reflected by the boundary between the dry coupling element and the transmitter and receiver circuits, which leads to an internal reflection of the analysis pulse in the dry coupling element. This is illustrated in FIG. 3: the first reflection is triggered by the boundary between the outer surface of the dry coupling element and the sample; this reflection is then reflected internally by the inner surface of the dry coupling element to form the second reflection of the analysis pulse on the dry-sample coupling boundary, which will be received by the apparatus. This second reflection is not interesting either; in fact, it is indeed problematic since it could be interpreted as representing a structural element in the sample. In existing analysis systems, this second reflection on the dry coupling element is generally not a problem. It can be easily handled by a time window blocking of the received signal so that the detection module does not look at the reflections in the part of the signal that contains the second reflection. However, this is only possible when the analyzer is only used to look at relatively shallow depths in the sample (eg to read matrix codes that are coated with paint). For an apparatus which is arranged to analyze a sample in depth, the second reflection of the dry coupling element can not be suppressed by a time window blocking without also losing interesting reflections. The dry coupling member is suitably thick enough for the second reflection of the dry coupling member to be received after all the reflections that could be received from the deepest point of interest in the sample. In many applications this will be the "back wall" of the sample. The appropriate thickness of the dry coupling element therefore depends on the depth of analysis. It also depends on the relative speed with which the analysis pulses travel in the dry coupling element and the sample. The dry coupling member suitably has a thickness greater than 0.5 mm and is preferably at least 1 mm. Preferably, the dry coupling member has a thickness of between 1 mm and 10 mm, and more preferably between 1.5 mm and 5 mm. The depth of analysis is preferably between 0 and 20 mm and more preferably between 0 and 15 mm. The dry coupling member is suitably thick enough for the greatest depth that the apparatus is capable of analyzing. This can be determined by time blockers and / or other camera settings. Note that the configuration of the device can be changed during use, for example by the operator who adjusts the time blockers. However, typically, the operator will not be able to go beyond a maximum depth that the device can analyze. One way of dealing with the second reflection would be to make the coupling element dry thicker than any conceivable sample. However, the ultrasonic waves spread more and lose energy as their path lengthens, and thus the dry coupling pad is preferably not thicker than necessary to delay the second reflection. In one embodiment, dry coupling elements having varying thicknesses may be provided with the analysis apparatus. The operator could then mount the dry coupling element that is most suitable for the required analysis depth. One way of doing this would be to have an analysis module comprising the dry coupling element, the transmitter and receiver circuits and the adaptive support element, which the operator could attach to the apparatus when necessary.
    [0013] However, this would increase the cost, and therefore it would be preferable to have an approach that selects the appropriate dry coupling thickness during the design and fabrication process. An example of a design and manufacturing method is shown in FIG. 4. The method begins at step 401 with the determination of the required analysis depth. Step 402 is an optional step of determining the rate at which the analysis pulses will travel in the dry coupling element and the expected sample material. In practice, it is desirable that this step has been performed previously to develop a tool such as a look-up table for translating a required analysis thickness into the corresponding dry coupling thickness. In step 403, the appropriate dry coupling thickness is selected. The apparatus is manufactured in step 404 to include the dry coupling element of the selected thickness. In step 405, the apparatus is arranged to detect reflections from the depth of analysis. This is shown as a separate step in Figure 4 for ease of illustration. In practice, step 405 can be performed as part of step 404.
    [0014] An example of a portable apparatus for capturing images below the surface of an object is shown in Figure 5. The apparatus 501 could have an integrated display, but in this example it produces images on a tablet 502. The device could be suitable, as a personal digital, would be wired, The device includes receiving signals also provide images to any PC display, laptop, assistant etc. The connection with a separate screen for-as shown, or wirelessly. a matrix network 503 for transmitting and ultrasound. Conveniently, the array is implemented by an ultrasound transducer comprising a plurality of electrodes arranged in an intersecting pattern to form an array of transducer elements. The transducer elements can be switched between transmission and reception. The portable apparatus comprises a dry coupling layer 504 for coupling the ultrasound signals into the object. The dry coupling layer also delays the ultrasound signals to allow time for the transducers to switch from transmission to reception. A dry coupling layer offers many advantages over other imaging systems, which tend to use liquids for coupling ultrasonic signals. This may not be practical in an industrial environment. If the liquid coupler is contained in a bladder, as is sometimes the case, it makes it difficult to obtain accurate depth measurements, which is not ideal for non-destructive testing applications. The matrix network 503 is two-dimensional, and therefore it is not necessary to move it on the object to obtain an image. A typical matrix array could be 30mm by 30mm in size, but the size and shape of the array may vary to suit the application. The device can be easily held against the object by the operator. Commonly, the operator will already have a good idea of where the object may have defects below the surface or defects in material; for example, a component may have been impacted or may contain one or more piercing holes or rivets that could cause stress concentrations. The apparatus appropriately processes the reflected pulses in real time, so that the operator can simply place the apparatus on a region of interest. The portable apparatus also includes a dial 505 that the operator can use to change the shape of the pulse and the corresponding matching filter. The most appropriate form of impulse may depend on the type of structural element that is captured and where it is located in the object. The operator 30 visualizes the object at different depths by adjusting the time window blocker through the display. The fact that the output of the device is on a portable display, such as a tablet 502, or on an integrated display, is advantageous since the operator can easily move the transducer on the object, or change the settings of B13663EN-DIV - DOL01-100019EN1 17 depending on what it sees on the display and can obtain instant results. In other arrangements, the operator may have to move between a non-portable display (such as a PC) and the object to scan it again each time a new layout or location is to be tested on the device. 'object. The apparatus and methods described herein are particularly suitable for detecting takeoffs and delaminations in composite materials such as carbon fiber reinforced polymers (CFRP). This is important for avionics maintenance. It can also be used to detect flaking around rivet holes, which can act as constraint concentrators. The apparatus is particularly suitable for applications in which it is desired to obtain images of a small region of a larger component. The device is lightweight, portable and easy to use. It can be easily held by hand by an operator to be placed where it is needed on the object. The terms "behind", "opposite" and the like are used herein to indicate relative positions of various components in the apparatus. In some embodiments, a layer that is "behind" or "in front" of another may be positioned directly by that other layer in the apparatus so that the two touch each other; in other embodiments, there may be one or more intervening layers. The "front" of the device is represented by the analysis surface. The inward direction points in a direction away from the scanning surface and toward the inside of the apparatus.
    [0015] Applicant discloses here in isolation each individual element described herein and any combination of two or more of these elements, within the limit where these elements or combinations can be made on the basis of the present specification as a whole in light of the general knowledge of those skilled in the art, regardless of whether these elements or combinations of elements solve the problems described herein, and without limiting the scope of the claims. SUMMARY OF THE INVENTION Applicant indicates that aspects of the present invention may consist of all such individual elements or combinations of elements. In view of the foregoing description, it will be apparent to those skilled in the art that various modifications can be made while remaining within the scope of the invention.
    权利要求:
    Claims (9)
    [0001]
    REVENDICATIONS1. An analysis apparatus for analyzing a sample at a particular depth, comprising: a transmission module arranged to transmit an analysis pulse to the sample; a receiving module arranged to receive reflections of the analysis pulse from the sample; a detection module arranged to detect reflections that have traveled from the particular depth in the sample to the analysis apparatus; and a dry coupling element which serves as a transmission medium for conducting the analysis pulse in the sample, the dry coupling element being sufficiently thick for a reflection which has traveled from the particular depth to arrive at the level of the analysis apparatus before a reflection which represents a second reflection of the analysis pulse on the boundary between the dry coupling element and the sample.
    [0002]
    2. Analysis apparatus according to claim 1, wherein the detection module is arranged to temporally block the received reflections so that the reflection which comes from the particular depth is detected and the reflection which represents the second reflection does not occur. not detected.
    [0003]
    3. Analysis apparatus according to claim 2, wherein the dry coupling element has a thickness of between 1 mm and 10 mm.
    [0004]
    4. Analysis apparatus according to claim 2, wherein the dry coupling element has a thickness of between 1 mm and 5 mm. 30
    [0005]
    5. A method of manufacturing an analysis apparatus according to claim 1.
    [0006]
    The manufacturing method according to claim 5 comprising: designing the apparatus, comprising: determining a particular depth in a sample that the analysis apparatus is to be able to analyze; and selecting a thickness for a dry coupling element to be used to conduct analysis pulses in the sample as a function of the particular depth; and physically produce the apparatus so designed.
    [0007]
    The manufacturing method according to claim 6, including selecting the thickness of the dry coupling member to be sufficient for reflection that has traveled from the particular depth in the sample to arrive. at the level of the analysis apparatus before a reflection which represents a second reflection of the analysis pulse on the boundary between the dry coupling element and the sample.
    [0008]
    The manufacturing method according to claim 7, comprising designing a detection module such that it can be arranged to detect a reflection that comes from the particular depth and not to detect a reflection that represents the second reflection of the analysis pulse on the boundary between the dry coupling element and the sample.
    [0009]
    The manufacturing method according to claim 8, comprising designing the detection module to include a time window block.
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    法律状态:
    2016-08-24| PLFP| Fee payment|Year of fee payment: 3 |
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    2017-09-15| PLSC| Search report ready|Effective date: 20170915 |
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    优先权:
    申请号 | 申请日 | 专利标题
    GB1315090.9A|GB2518817B|2013-08-23|2013-08-23|Sensor module with adaptive backing layer|
    FR1457908A|FR3009870B1|2013-08-23|2014-08-21|DETECTOR MODULE PROVIDED WITH AN ADAPTIVE SUPPORT ELEMENT|
    FR1552165A|FR3018610B1|2013-08-23|2015-03-17|DETECTOR MODULE PROVIDED WITH AN ADAPTIVE SUPPORT ELEMENT|FR1552165A| FR3018610B1|2013-08-23|2015-03-17|DETECTOR MODULE PROVIDED WITH AN ADAPTIVE SUPPORT ELEMENT|
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